Video From 14w5048: Imaging and Modeling in Electron Microscopy - Recent Advances

Friday, May 23, 2014 09:41 - 10:03
On accurate modeling of electron scattering factors for TEM, STEM and diffraction
Ivan Pedro Lobato Hoyos, Video: On accurate modeling of electron scattering factors for TEM, STEM and diffraction
Ivan Pedro Lobato Hoyos, Video: On accurate modeling of electron scattering factors for TEM, STEM and diffraction
Ivan Pedro Lobato Hoyos, On accurate modeling of electron scattering factors for TEM, STEM and diffraction, Imaging and Modeling in Electron Microscopy - Recent Advances, BIRS, BIRS talk, 14w5048, math, mathematics, video
Banff International Research Station
Banff International Research Station
presentation
mpeg4
60M
http://www.birs.ca/events/2014/5-day-workshops/14w5048/videos

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