Imaging and Modeling in Electron Microscopy - Recent Advances
Videos from BIRS Workshop
Thomas Vogt, University of South Carolina - NanoCenter
Monday May 19, 2014 08:58 - 09:40
From Picture to Data - the iconoclastic struggle in materials science
Christian Dwyer, Forschungszentrum Juelich
Monday May 19, 2014 09:47 - 10:22
Simulating core-loss scattering in the STEM
Chandrajit Bajaj, University of Texas at Austin
Monday May 19, 2014 10:46 - 11:53
Macro-molecular Map and Model Refinement Techniques for Electron Microscopy
Otmar Scherzer, University of Vienna
Monday May 19, 2014 14:18 - 14:52
Optical Flow Decomposition on Evolving Surfaces
Deanna Needell, Claremont McKenna College
Monday May 19, 2014 14:52 - 15:28
Greedy algorithms in super-resolution
Rachel Ward, UT Austin
Monday May 19, 2014 15:47 - 16:21
Linear dimension reduction in the L₁ norm: When and how is it possible?
Andrew Stevens, Pacific NW Natl Lab / Duke Univ
Monday May 19, 2014 16:55 - 17:24
Machine Learning and Compressive Sensing for Electron Microscopy
Mark Davenport, Georgia Institute of Technology
Monday May 19, 2014 17:26 - 18:04
Adaptive sensing for compressive imaging
Yoel Shkolnisky, Tel-Aviv University
Tuesday May 20, 2014 08:48 - 09:51
Viewing Direction Estimation in cryo-EM Using Synchronization
Nigel Browning, Pacific Northwest National Laboratory
Tuesday May 20, 2014 10:13 - 10:47
Data analysis challenges for observing protein dynamics with fast electron pulses
Amit Singer, Princeton University
Tuesday May 20, 2014 10:49 - 11:48
Covariance Matrix Estimation for the Cryo-EM Heterogeneity Problem
Scott Findlay, Monash University
Tuesday May 20, 2014 14:07 - 14:36
Quantitative interpretation of atomic resolution scanning transmission electron microscopy images in the presence of multiple scattering: progress and challenges
Jerzy Sadowski, Brookhaven National Laboratory
Tuesday May 20, 2014 14:38 - 15:14
Spectro-microscopy of 2D materials: challenges and perspectives
Joachim Mayer, RWTH-Aachen
Tuesday May 20, 2014 15:37 - 16:27
Chromatic Aberration Correction in TEM and its impact on new experiments and signals
Bryan Reed, Integrated Dynamic Electron Solutions, Inc.
Tuesday May 20, 2014 16:28 - 17:08
Movie Mode DTEM
Felix Krahmer, University of Göttingen
Wednesday May 21, 2014 08:48 - 09:41
A partial derandomization of phase retrieval via PhaseLift
Philipp Lamby, Texas A&M University
Wednesday May 21, 2014 09:42 - 10:20
Solving the Regularized Reconstruction Problems Arising in Limited-Angle Tomography
Dirk Van Dyck, University of Antwerp
Wednesday May 21, 2014 10:42 - 11:41
Addressing Feynman’s Challenge - The 3D Shape of NanoCrystals from Single Projections at Atomic Resolution
Benjamin Berkels, RWTH Aachen University
Thursday May 22, 2014 08:47 - 09:46
Image registration techniques for electron microscopy
Andrew Yankovich, University of Wisconsin-Madison
Thursday May 22, 2014 09:47 - 10:23
Applications of NR registration for enhanced signal to noise ratio, spatial precision, and standardless atom counting in STEM images
Gitta Kutyniok, LMU Munich
Thursday May 22, 2014 10:38 - 11:43
A Compressed Sensing Approach to Component Separation in Imaging
Niklas Mevenkamp, RWTH-Aachen
Thursday May 22, 2014 16:52 - 17:20
Non-local Means based Denoising and Reconstruction of STEM Images
Teng Zhang, Princeton University
Thursday May 22, 2014 17:22 - 17:58
A Semidefinite Programming Approach to 3D Reconstruction of Macromolecules
Kevin Kelly, Rice University
Friday May 23, 2014 08:46 - 09:34
Multidimensional Compressive Imaging with a Two-Dimensional Modulator
Ivan Pedro Lobato Hoyos, University of Antwerp
Friday May 23, 2014 09:41 - 10:03
On accurate modeling of electron scattering factors for TEM, STEM and diffraction
Bin Han, University of Alberta
Friday May 23, 2014 10:34 - 11:19
Image denoising using directional separable complex tight framelets
